{"entities":{"Q2546337":{"pageid":2557080,"ns":120,"title":"Item:Q2546337","lastrevid":79293452,"modified":"2026-05-06T13:35:19Z","type":"item","id":"Q2546337","labels":{"en":{"language":"en","value":"Construction of tests for checking combinational circuits"}},"descriptions":{"en":{"language":"en","value":"scientific article; zbMATH DE number 3345394"}},"aliases":{},"claims":{"P31":[{"mainsnak":{"snaktype":"value","property":"P31","hash":"fd5912e4dab4b881a8eb0eb27e7893fef55176ad","datavalue":{"value":{"entity-type":"item","numeric-id":56887,"id":"Q56887"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q2546337$1910FE18-43F3-4406-91D8-4C5C2908AF61","rank":"normal"}],"P159":[{"mainsnak":{"snaktype":"value","property":"P159","hash":"70fc3691ea84b5996aeb990cf92d7758944ddd48","datavalue":{"value":{"text":"Construction of tests for checking combinational circuits","language":"en"},"type":"monolingualtext"},"datatype":"monolingualtext"},"type":"statement","id":"Q2546337$44A1AED3-91F8-4B2C-835F-1AA10FE19D4C","rank":"normal"}],"P225":[{"mainsnak":{"snaktype":"value","property":"P225","hash":"dba4a52fbb5f16080a01a0beb764bfd55ec6fcf1","datavalue":{"value":"0217.29202","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q2546337$843E5051-18CF-4655-8E1D-A1B7D5FB4BC2","rank":"normal"}],"P16":[{"mainsnak":{"snaktype":"value","property":"P16","hash":"73ebd106a2307012f2b0514eda8319faf0906411","datavalue":{"value":{"entity-type":"item","numeric-id":755539,"id":"Q755539"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q2546337$4791A400-E54B-4A79-BB35-CACDF32CF975","rank":"normal"}],"P200":[{"mainsnak":{"snaktype":"value","property":"P200","hash":"33359fd8a77e9cce0cfaf7c91dc047e11a0fed75","datavalue":{"value":{"entity-type":"item","numeric-id":109332,"id":"Q109332"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q2546337$5F24DCCB-987B-49A4-8711-D9ECC1F7DC87","rank":"normal"}],"P28":[{"mainsnak":{"snaktype":"value","property":"P28","hash":"e293d9e9c8dba13b0feb4b9b16887fc748f70c6f","datavalue":{"value":{"time":"+1970-00-00T00:00:00Z","timezone":0,"before":0,"after":0,"precision":9,"calendarmodel":"http://www.wikidata.org/entity/Q1985727"},"type":"time"},"datatype":"time"},"type":"statement","id":"Q2546337$C3F78329-F346-421B-AF18-1BFCEA37C6B7","rank":"normal"}],"P226":[{"mainsnak":{"snaktype":"value","property":"P226","hash":"1e903e68a16880f66ed79a0863889f1b2d3c837c","datavalue":{"value":"94C10","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q2546337$4A326546-7E92-4E3F-814E-2758C1704B86","rank":"normal"}],"P1451":[{"mainsnak":{"snaktype":"value","property":"P1451","hash":"2ff2c7ee01073b14613dcea6988f511c17624518","datavalue":{"value":"3345394","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q2546337$3928CF81-5927-475F-9CA9-251ECC324AD5","rank":"normal"}],"P1460":[{"mainsnak":{"snaktype":"value","property":"P1460","hash":"57f7fea50d2ce1b39b695c4a1313582eed405e38","datavalue":{"value":{"entity-type":"item","numeric-id":5976449,"id":"Q5976449"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q2546337$39AD8BFE-3CCA-4BD2-97FE-72EA21400489","rank":"normal"}]},"sitelinks":{"mardi":{"site":"mardi","title":"Construction of tests for checking combinational circuits","badges":[],"url":"https://portal.mardi4nfdi.de/wiki/Construction_of_tests_for_checking_combinational_circuits"}}}}}