{"entities":{"Q4571371":{"pageid":6600960,"ns":120,"title":"Item:Q4571371","lastrevid":89836142,"modified":"2026-06-04T18:23:41Z","type":"item","id":"Q4571371","labels":{"en":{"language":"en","value":"A new class of sequential circuits with combinational test generation complexity"}},"descriptions":{"en":{"language":"en","value":"scientific article; zbMATH DE number 6899521"}},"aliases":{},"claims":{"P31":[{"mainsnak":{"snaktype":"value","property":"P31","hash":"fd5912e4dab4b881a8eb0eb27e7893fef55176ad","datavalue":{"value":{"entity-type":"item","numeric-id":56887,"id":"Q56887"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4571371$3C1E77C5-D646-4796-8394-2E3A81438433","rank":"normal"}],"P159":[{"mainsnak":{"snaktype":"value","property":"P159","hash":"760bd7596573b304c7f44cb125b30427d452875b","datavalue":{"value":{"text":"A new class of sequential circuits with combinational test generation complexity","language":"en"},"type":"monolingualtext"},"datatype":"monolingualtext"},"type":"statement","id":"Q4571371$376B2F4C-0C56-4797-BD88-DC564FAFA691","rank":"normal"}],"P225":[{"mainsnak":{"snaktype":"value","property":"P225","hash":"2362986cd7743db6aef4f1e55969d7514b2a7a5b","datavalue":{"value":"1391.94896","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$709CECBF-3AEB-4E7A-B971-68A63689B8F0","rank":"normal"}],"P27":[{"mainsnak":{"snaktype":"value","property":"P27","hash":"dc501af0b49e5ff8ac8bb1a684beb2d247a844f9","datavalue":{"value":"10.1109/12.869321","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$CC3FDA6B-0E0B-4DCB-8073-0C40822A6FAB","rank":"normal"}],"P16":[{"mainsnak":{"snaktype":"value","property":"P16","hash":"14455f890ec28cb47f9022f0aa4739800056644b","datavalue":{"value":{"entity-type":"item","numeric-id":673012,"id":"Q673012"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4571371$6B7B2283-E1B9-4137-A206-5540840B6E7C","rank":"normal"}],"P200":[{"mainsnak":{"snaktype":"value","property":"P200","hash":"cb95ba1181f89055fe808aa2c36bea9d3930d0fc","datavalue":{"value":{"entity-type":"item","numeric-id":80442,"id":"Q80442"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4571371$1F9C3037-54B8-424B-A2B0-CE5D2ACD9997","rank":"normal"}],"P28":[{"mainsnak":{"snaktype":"value","property":"P28","hash":"20fc1ac084e12d18c0e5ff948cffdf2d3bf183d6","datavalue":{"value":{"time":"+2018-07-09T00:00:00Z","timezone":0,"before":0,"after":0,"precision":11,"calendarmodel":"http://www.wikidata.org/entity/Q1985727"},"type":"time"},"datatype":"time"},"type":"statement","id":"Q4571371$8862C925-4AA7-4490-8608-BBBC4CF8D838","rank":"normal"}],"P205":[{"mainsnak":{"snaktype":"value","property":"P205","hash":"37fc9532be391c553a15179a4a0cb1f104eb0d78","datavalue":{"value":"https://semanticscholar.org/paper/d11d90e6828d9a63ca4c69be2eb5bf9bcc42437c","type":"string"},"datatype":"url"},"type":"statement","id":"Q4571371$70E9499A-5A49-45B9-9D35-F4CFD03C0E13","rank":"normal"}],"P226":[{"mainsnak":{"snaktype":"value","property":"P226","hash":"2d65091154bcdcd55b19c17aadaa169aee2e3523","datavalue":{"value":"94C05","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$5CB71D65-B0F3-488A-B578-14EA833F2288","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P226","hash":"9b78776a56fc28cdd893baa47605a105412b838a","datavalue":{"value":"68Q45","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$D5537447-D939-40DE-B639-198F08D1E822","rank":"normal"}],"P1451":[{"mainsnak":{"snaktype":"value","property":"P1451","hash":"52c83e226b76e267eac6e254a4cfd68a8c6c5f7f","datavalue":{"value":"6899521","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$51A5024C-6307-486D-8A88-D3380AACD81A","rank":"normal"}],"P1460":[{"mainsnak":{"snaktype":"value","property":"P1460","hash":"57f7fea50d2ce1b39b695c4a1313582eed405e38","datavalue":{"value":{"entity-type":"item","numeric-id":5976449,"id":"Q5976449"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4571371$E1E8BBD3-1A4E-4DA9-A632-BEF1E995D207","rank":"normal"}],"P388":[{"mainsnak":{"snaktype":"value","property":"P388","hash":"a7a89b67c9a53c827c82eca3bd0ce1465f1c093d","datavalue":{"value":"W2134921041","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4571371$90256B3E-3ED6-46CF-A153-AB5D22CF8E52","rank":"normal"}]},"sitelinks":{"mardi":{"site":"mardi","title":"A new class of sequential circuits with combinational test generation complexity","badges":[],"url":"https://portal.mardi4nfdi.de/wiki/A_new_class_of_sequential_circuits_with_combinational_test_generation_complexity"}}}}}