{"entities":{"Q4590265":{"pageid":6619850,"ns":120,"title":"Item:Q4590265","lastrevid":89927978,"modified":"2026-06-04T18:38:17Z","type":"item","id":"Q4590265","labels":{"en":{"language":"en","value":"Reliability Analysis of Large Circuits Using Scalable Techniques and Tools"}},"descriptions":{"en":{"language":"en","value":"scientific article; zbMATH DE number 6809829"}},"aliases":{},"claims":{"P31":[{"mainsnak":{"snaktype":"value","property":"P31","hash":"fd5912e4dab4b881a8eb0eb27e7893fef55176ad","datavalue":{"value":{"entity-type":"item","numeric-id":56887,"id":"Q56887"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$94820E00-7D21-4729-9B30-55303B30A889","rank":"normal"}],"P159":[{"mainsnak":{"snaktype":"value","property":"P159","hash":"ccd79c5e2ee5241b57c4c9da4fe825a328b05d76","datavalue":{"value":{"text":"Reliability Analysis of Large Circuits Using Scalable Techniques and Tools","language":"en"},"type":"monolingualtext"},"datatype":"monolingualtext"},"type":"statement","id":"Q4590265$4F9FBB6A-1A73-410C-8215-E88F20768E3E","rank":"normal"}],"P225":[{"mainsnak":{"snaktype":"value","property":"P225","hash":"03984c3dd63660b72e707f89494656ae6e1499c9","datavalue":{"value":"1374.94961","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$F4B724ED-0093-4BB5-B481-2E4A5B2870B6","rank":"normal"}],"P27":[{"mainsnak":{"snaktype":"value","property":"P27","hash":"b11c3dfe3cc20393175569568ba98d736d2751e6","datavalue":{"value":"10.1109/TCSI.2007.907863","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$0CAF081B-A117-4BF6-A67F-390B373BFA45","rank":"normal"}],"P16":[{"mainsnak":{"snaktype":"value","property":"P16","hash":"a4e54021f426eb87c129abb24d70f5f4a34b9a05","datavalue":{"value":{"entity-type":"item","numeric-id":3863349,"id":"Q3863349"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$8114E474-99E3-4CA6-9025-B7D78C77C4E5","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"55969d1c1711426473ebd199c3c528d38c8d87d0","datavalue":{"value":{"entity-type":"item","numeric-id":2506260,"id":"Q2506260"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$45BCB34E-B7E2-4924-AE23-AC04829293FD","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"d778a5558365f67a03c903e7a99385f53144d27a","datavalue":{"value":{"entity-type":"item","numeric-id":1022423,"id":"Q1022423"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$98B19DFE-F4FF-4E9A-B351-97498C89268D","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"9a139625287239e13f3291cfb6edd4f04e0ce4f6","datavalue":{"value":{"entity-type":"item","numeric-id":1106655,"id":"Q1106655"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$4D9B7C10-1947-467E-A1A5-61DEDC15DF2D","rank":"normal"}],"P200":[{"mainsnak":{"snaktype":"value","property":"P200","hash":"dd6ce97fd4ae426ff013d991db587215663fa9d9","datavalue":{"value":{"entity-type":"item","numeric-id":4590152,"id":"Q4590152"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$4C130F03-E38F-4119-8771-AAE988E6B519","rank":"normal"}],"P28":[{"mainsnak":{"snaktype":"value","property":"P28","hash":"b84b2688f8b5d3f732b72b9335532998ad34228e","datavalue":{"value":{"time":"+2017-11-20T00:00:00Z","timezone":0,"before":0,"after":0,"precision":11,"calendarmodel":"http://www.wikidata.org/entity/Q1985727"},"type":"time"},"datatype":"time"},"type":"statement","id":"Q4590265$FBD39759-EB42-4493-B4C0-FEFC42B178BF","rank":"normal"}],"P226":[{"mainsnak":{"snaktype":"value","property":"P226","hash":"effafbcb0d14f283a888b55b376e46f500ec447a","datavalue":{"value":"94C12","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$CFCAF740-6C98-413C-9535-20746FC0F0BA","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P226","hash":"f3cb322112ae56aec500b334b7351f32fb107365","datavalue":{"value":"68W35","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$4AFC1ADD-58B4-4930-9792-C8C8C0F936E1","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P226","hash":"8d8a22ace48964288ca1ed080fca5299ff532395","datavalue":{"value":"68M15","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$8B836FD5-EF46-4528-B2F2-49BD6C4177B8","rank":"normal"}],"P1451":[{"mainsnak":{"snaktype":"value","property":"P1451","hash":"0c3148dfe88d90c75f3e8548669d86d4a8710cf3","datavalue":{"value":"6809829","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$162D2E23-6794-431C-BFFB-3F985467404E","rank":"normal"}],"P1460":[{"mainsnak":{"snaktype":"value","property":"P1460","hash":"57f7fea50d2ce1b39b695c4a1313582eed405e38","datavalue":{"value":{"entity-type":"item","numeric-id":5976449,"id":"Q5976449"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q4590265$694F9D15-61C0-41E2-B02A-FCB7ADA7092F","rank":"normal"}],"P205":[{"mainsnak":{"snaktype":"value","property":"P205","hash":"b5ee9ba8c5dd803bfafc30abfe6a41db3ee2e479","datavalue":{"value":"https://doi.org/10.1109/tcsi.2007.907863","type":"string"},"datatype":"url"},"type":"statement","id":"Q4590265$2AE48685-29A3-4E5B-BF87-A678116CECA1","rank":"normal"}],"P388":[{"mainsnak":{"snaktype":"value","property":"P388","hash":"421148c90e946961d9498da6ece7c7ed77779e8e","datavalue":{"value":"W2034449190","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$E5F80C78-259C-4737-AD26-0F7023868FC5","rank":"normal"}],"P12":[{"mainsnak":{"snaktype":"value","property":"P12","hash":"7dda5658006e15887d80654ea53f69f7cf9deaee","datavalue":{"value":"Q57526803","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q4590265$2280A3D4-8C30-4767-9842-DB8DD26F2E90","rank":"normal"}]},"sitelinks":{"mardi":{"site":"mardi","title":"Reliability Analysis of Large Circuits Using Scalable Techniques and Tools","badges":[],"url":"https://portal.mardi4nfdi.de/wiki/Reliability_Analysis_of_Large_Circuits_Using_Scalable_Techniques_and_Tools"}}}}}