{"entities":{"Q6570834":{"pageid":14181989,"ns":120,"title":"Item:Q6570834","lastrevid":95569406,"modified":"2026-06-05T09:18:25Z","type":"item","id":"Q6570834","labels":{"en":{"language":"en","value":"Statistics for microelectronics"}},"descriptions":{"en":{"language":"en","value":"scientific article; zbMATH DE number 7879669"}},"aliases":{},"claims":{"P31":[{"mainsnak":{"snaktype":"value","property":"P31","hash":"fd5912e4dab4b881a8eb0eb27e7893fef55176ad","datavalue":{"value":{"entity-type":"item","numeric-id":56887,"id":"Q56887"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$E75616DF-AFBF-4C45-BD95-82439813B324","rank":"normal"}],"P159":[{"mainsnak":{"snaktype":"value","property":"P159","hash":"00563deab48d6afc8c51be3138c7896788cbda99","datavalue":{"value":{"text":"Statistics for microelectronics","language":"en"},"type":"monolingualtext"},"datatype":"monolingualtext"},"type":"statement","id":"Q6570834$74FBBC5E-E6E8-40D8-A89C-ADF068F15A59","rank":"normal"}],"P16":[{"mainsnak":{"snaktype":"value","property":"P16","hash":"af27c8a0b94d1ec46a6ce934573195809ef8513b","datavalue":{"value":{"entity-type":"item","numeric-id":257550,"id":"Q257550"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$546A4BD5-DF03-4E21-AD7A-8A17BE5DCB84","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"c8a66838c4e54aac866a94d8aa1875b1e5642b0a","datavalue":{"value":{"entity-type":"item","numeric-id":1694013,"id":"Q1694013"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$3809A647-B6AE-4148-94BD-F912CBD09B7A","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"60015ade3e64318e6b04c82ebbf3480e84a7033d","datavalue":{"value":{"entity-type":"item","numeric-id":2361213,"id":"Q2361213"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$82ED4996-9B0D-4269-BEB6-A5F8D36CEDCC","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P16","hash":"e0358e7a3306b4137bc70791a5e2e4f2b6ca0615","datavalue":{"value":{"entity-type":"item","numeric-id":2361215,"id":"Q2361215"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$B391DE85-957E-4884-971E-A74E34EAFF3F","rank":"normal"}],"P200":[{"mainsnak":{"snaktype":"value","property":"P200","hash":"f25b94b50fe7680e791bf89b311bfc2e650c6a4e","datavalue":{"value":{"entity-type":"item","numeric-id":69913,"id":"Q69913"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$FDCF6F27-8318-4F73-8267-82AD0DCB3735","rank":"normal"}],"P28":[{"mainsnak":{"snaktype":"value","property":"P28","hash":"181a3dca03d8764022939edb0e7b82936e921073","datavalue":{"value":{"time":"+2024-07-10T00:00:00Z","timezone":0,"before":0,"after":0,"precision":11,"calendarmodel":"http://www.wikidata.org/entity/Q1985727"},"type":"time"},"datatype":"time"},"type":"statement","id":"Q6570834$4C57A9DF-61DC-40E6-8A9A-860B4AF35FFD","rank":"normal"}],"P226":[{"mainsnak":{"snaktype":"value","property":"P226","hash":"923277c2ca15164b9d1e9edd451ca037b356ac9e","datavalue":{"value":"62-XX","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q6570834$96B4DE76-5312-4D57-96DA-337BF1C5DEFE","rank":"normal"}],"P1451":[{"mainsnak":{"snaktype":"value","property":"P1451","hash":"decc7f53070cb2aed99489d8e738542c119202dc","datavalue":{"value":"7879669","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q6570834$DDFE7600-7371-400F-8EC8-61D7019695E2","rank":"normal"}],"P1450":[{"mainsnak":{"snaktype":"value","property":"P1450","hash":"4d3fea7f6f2bc66cdad54015041bbefa26c6b9e8","datavalue":{"value":"semiconductor manufacturing","type":"string"},"datatype":"string"},"type":"statement","id":"Q6570834$1F3C5303-99FD-4521-A420-36072BFB27CE","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"56fb204a4244da7c85c3cb7f11c3efc03fa56404","datavalue":{"value":"integrated circuit","type":"string"},"datatype":"string"},"type":"statement","id":"Q6570834$85B4C49B-C201-4259-977C-E3D18EBB54AA","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"041796aa66fbdbc3a0976769c44b768bbd9ced67","datavalue":{"value":"process control","type":"string"},"datatype":"string"},"type":"statement","id":"Q6570834$A911D98E-9691-47C1-9B1F-4BFBB204B61A","rank":"normal"}],"P1460":[{"mainsnak":{"snaktype":"value","property":"P1460","hash":"57f7fea50d2ce1b39b695c4a1313582eed405e38","datavalue":{"value":{"entity-type":"item","numeric-id":5976449,"id":"Q5976449"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$A4066C22-E53D-4123-A3B1-44C3754462A3","rank":"normal"}],"P223":[{"mainsnak":{"snaktype":"value","property":"P223","hash":"9e328d34b7e64c7ed351a65dfbc2134b47bd48aa","datavalue":{"value":{"entity-type":"item","numeric-id":5391290,"id":"Q5391290"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$DA34FCB1-3B2C-4CF2-ABBC-DA4277AC7D60","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P223","hash":"85c67d3357cc280c5d2d7db0ac929e5e0039a201","datavalue":{"value":{"entity-type":"item","numeric-id":2361216,"id":"Q2361216"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$CED43016-E4FF-4978-883A-4FC764C383FE","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P223","hash":"2496a2ae5452e5a3978e9ac8d9e4b5d0f17caf52","datavalue":{"value":{"entity-type":"item","numeric-id":3077493,"id":"Q3077493"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q6570834$0CAE42F7-73F0-4560-8431-07128026FD9C","rank":"normal"}],"P27":[{"mainsnak":{"snaktype":"value","property":"P27","hash":"d994314867080df77d22edd3a2ac60d956e95831","datavalue":{"value":"10.1002/ASMB.1994","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q6570834$3476D1D9-D71B-4714-93C6-EB1312FB236D","rank":"normal"}]},"sitelinks":{"mardi":{"site":"mardi","title":"Statistics for microelectronics","badges":[],"url":"https://portal.mardi4nfdi.de/wiki/Statistics_for_microelectronics"}}}}}