{"entities":{"Q786790":{"pageid":788638,"ns":120,"title":"Item:Q786790","lastrevid":64328001,"modified":"2026-04-11T19:06:53Z","type":"item","id":"Q786790","labels":{"en":{"language":"en","value":"Ring testing of combinational circuits"}},"descriptions":{"en":{"language":"en","value":"scientific article; zbMATH DE number 3837929"}},"aliases":{},"claims":{"P31":[{"mainsnak":{"snaktype":"value","property":"P31","hash":"fd5912e4dab4b881a8eb0eb27e7893fef55176ad","datavalue":{"value":{"entity-type":"item","numeric-id":56887,"id":"Q56887"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q786790$1DAF39DD-E9C7-4AF2-9B33-7F4D7DA99714","rank":"normal"}],"P159":[{"mainsnak":{"snaktype":"value","property":"P159","hash":"787cbb4e5c3304a5f9e937f401e57db04a453135","datavalue":{"value":{"text":"Ring testing of combinational circuits","language":"en"},"type":"monolingualtext"},"datatype":"monolingualtext"},"type":"statement","id":"Q786790$9262641F-766C-4945-A697-F6F24E30AD3F","rank":"normal"}],"P225":[{"mainsnak":{"snaktype":"value","property":"P225","hash":"4d84dd8813e52be0f3f01f9c32bd1636da9e9d6e","datavalue":{"value":"0527.94012","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q786790$BCC0A4CB-D068-49F3-B7D8-7165FAA11A1C","rank":"normal"}],"P16":[{"mainsnak":{"snaktype":"value","property":"P16","hash":"8898d17a9cf71a36b04f1fc8d2a8df01caae39b7","datavalue":{"value":{"entity-type":"item","numeric-id":786789,"id":"Q786789"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q786790$78A1777D-6CD1-4487-9A0F-82C2708C3676","rank":"normal"}],"P200":[{"mainsnak":{"snaktype":"value","property":"P200","hash":"33359fd8a77e9cce0cfaf7c91dc047e11a0fed75","datavalue":{"value":{"entity-type":"item","numeric-id":109332,"id":"Q109332"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q786790$5B03AD5D-0E88-48F3-8D33-253736E662F9","rank":"normal"}],"P28":[{"mainsnak":{"snaktype":"value","property":"P28","hash":"0136733d5dd7d9f4d36f24c87a0b8375ae1cb2fd","datavalue":{"value":{"time":"+1983-00-00T00:00:00Z","timezone":0,"before":0,"after":0,"precision":9,"calendarmodel":"http://www.wikidata.org/entity/Q1985727"},"type":"time"},"datatype":"time"},"type":"statement","id":"Q786790$BE21B07E-C506-4D6F-BA31-DC698AFBA6BE","rank":"normal"}],"P226":[{"mainsnak":{"snaktype":"value","property":"P226","hash":"1e903e68a16880f66ed79a0863889f1b2d3c837c","datavalue":{"value":"94C10","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q786790$BD78A298-C221-486A-95BA-B2FBBF280426","rank":"normal"}],"P1451":[{"mainsnak":{"snaktype":"value","property":"P1451","hash":"60563e8264d12c898430ea4be273c4be9118a30c","datavalue":{"value":"3837929","type":"string"},"datatype":"external-id"},"type":"statement","id":"Q786790$C1644546-D4BC-4202-93CB-743260ACAC56","rank":"normal"}],"P1450":[{"mainsnak":{"snaktype":"value","property":"P1450","hash":"3255bcab155270a1b334b8e3a8663d48491c84f5","datavalue":{"value":"combinational circuits","type":"string"},"datatype":"string"},"type":"statement","id":"Q786790$3A13AF21-156B-4431-83EF-4CAC53D131CB","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"5cfc79edf190778c24fdbd9385cfe925d57fbdd6","datavalue":{"value":"reliability","type":"string"},"datatype":"string"},"type":"statement","id":"Q786790$E343F63D-177A-4A70-BC2B-55EDE3378BB8","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"ba121b9e15d787d1595fee3323bba757b3717406","datavalue":{"value":"hardware complexity","type":"string"},"datatype":"string"},"type":"statement","id":"Q786790$93DF6E35-8C71-4BAC-918B-AF75C2B97234","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"48ddf43eca498c7e7087cd696beb82ea63925320","datavalue":{"value":"algorithm","type":"string"},"datatype":"string"},"type":"statement","id":"Q786790$046C764F-7995-43F6-BF3F-02CB77CBA15D","rank":"normal"},{"mainsnak":{"snaktype":"value","property":"P1450","hash":"ebda97e2e57904cbc446e64df7b931447bb1f566","datavalue":{"value":"operability tests","type":"string"},"datatype":"string"},"type":"statement","id":"Q786790$ADC95E6E-1592-4E35-A551-4D7C7D909C90","rank":"normal"}],"P1460":[{"mainsnak":{"snaktype":"value","property":"P1460","hash":"57f7fea50d2ce1b39b695c4a1313582eed405e38","datavalue":{"value":{"entity-type":"item","numeric-id":5976449,"id":"Q5976449"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q786790$002531AE-29E4-4177-AD22-F1FD52C8C525","rank":"normal"}]},"sitelinks":{"mardi":{"site":"mardi","title":"Ring testing of combinational circuits","badges":[],"url":"https://portal.mardi4nfdi.de/wiki/Ring_testing_of_combinational_circuits"}}}}}