Pages that link to "Item:Q2381752"
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The following pages link to A review of accelerated test models (Q2381752):
Displayed 28 items.
- Optimal allocations for load-sharing \(k\)-out-of-\(n\):F systems (Q1007443) (← links)
- Two-state optimal maintenance planning of repairable systems with covariate effects (Q1651577) (← links)
- Filtering and tracking survival propensity (reconsidering the foundations of reliability) (Q1790365) (← links)
- The transformed inverse Gaussian process as an age- and state-dependent degradation model (Q1985162) (← links)
- Optimal design of reliability acceptance sampling plan based on sequential order statistics (Q2009808) (← links)
- Integrated optimization of test case selection and sequencing for reliability testing of the mainboard of Internet backbone routers (Q2077972) (← links)
- Reliability testing for product return prediction (Q2079450) (← links)
- Inverse Gaussian process based reliability analysis for constant-stress accelerated degradation data (Q2109872) (← links)
- Fiducial inference-based failure mechanism consistency analysis for accelerated life and degradation tests (Q2109894) (← links)
- Optimal plan for Wiener constant-stress accelerated degradation model (Q2183044) (← links)
- Regression methods for improved lifespan modeling of low voltage machine insulation (Q2228931) (← links)
- A new statistical inference method for multi-stress accelerated life testing based on random variable transformation (Q2240307) (← links)
- Nonlinear mixed reliability model with non-constant shape parameter of aviation cables (Q2243467) (← links)
- Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring (Q3183861) (← links)
- Equivalent accelerated life testing plans for log-location-scale distributions (Q3580164) (← links)
- Estimating Percentiles of Time-to-Failure Distribution Obtained from a Linear Degradation Model Using Kernel Density Method (Q3652724) (← links)
- Degradation Modeling, Analysis, and Applications on Lifetime Prediction (Q4559443) (← links)
- Optimal Designs for LED Degradation Modeling (Q4559449) (← links)
- Combining binomial test data via two‐stage solutions (Q4620235) (← links)
- Standardized lifetime-capability and warranty-return-rate-based suppliers qualification and selection with accelerated Weibull-life type II testing data (Q5046807) (← links)
- A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions (Q5051085) (← links)
- OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS (Q5056606) (← links)
- A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality (Q5084917) (← links)
- Bayesian optimum accelerated life test plans based on quantile regression (Q5088123) (← links)
- Bivariate degradation analysis of products based on Wiener processes and copulas (Q5218868) (← links)
- A QUANTILE-BASED PROBABILISTIC MEAN VALUE THEOREM (Q5358078) (← links)
- A stochastic time scale based framework for system reliability under a Markovian dynamic environment (Q6079103) (← links)
- Stochastic comparisons and dynamic information of random lifetimes in a replacement model (Q6162013) (← links)