Pages that link to "Item:Q2855388"

The following pages link to Fast electromagnetic imaging of thin inclusions in half-space affected by random scatterers (Q2855388):

Displaying 7 items.

• Defect detection from multi-frequency limited data via topological sensitivity (Q275333) (← links)
• Analysis of MUSIC-type imaging functional for single, thin electromagnetic inhomogeneity in limited-view inverse scattering problem (Q349826) (← links)
• Topological derivative strategy for one-step iteration imaging of arbitrary shaped thin, curve-like electromagnetic inclusions (Q422958) (← links)
• Multi-frequency topological derivative for approximate shape acquisition of curve-like thin electromagnetic inhomogeneities (Q488686) (← links)
• Multi-frequency subspace migration for imaging of perfectly conducting, arc-like cracks in full- and limited-view inverse scattering problems (Q728914) (← links)
• A novel study on subspace migration for imaging of a sound-hard arc (Q1672658) (← links)
• Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks (Q1685474) (← links)