Pages that link to "Item:Q2876120"

The following pages link to Simulation-Based Inspection Policies for a One-Shot System in Storage Over a Finite Time Span (Q2876120):

Displaying 2 items.

• A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions (Q5051085) (← links)
• A sampling plan for one-shot systems considering destructive inspection (Q5077457) (← links)