Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792): Difference between revisions
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Property / author: Feng-Lei Huang / rank | |||
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Latest revision as of 21:56, 19 March 2024
scientific article
Language | Label | Description | Also known as |
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English | Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model |
scientific article |
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Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (English)
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25 February 2020
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polymer-bonded explosives
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impact-shear ignition
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void distortion
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shear crack hotspot
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void collapse hotspot
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