Multiple step-stress accelerated life test: the tampered failure rate model (Q4275875): Difference between revisions

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+A tampered failure rate model for step-stress accelerated life test
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+Bayesian estimation and optimal designs in partially accelerated life testing
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+Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution
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+Accelerated Life Testing - Step-Stress Models and Data Analyses
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+Equivalence of the tampered random variable and the tampered failure rate models in accelerated lifetesting for a class of life distributions having the ‘setting the clock back to zero property'
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+Inference for step-stress accelerated life tests
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