Optimal design of accelerated life tests under modified stress loading methods (Q4266302): Difference between revisions

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+Q4032001
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+Optimum simple step-stress accelerated life tests with censoring
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+Optimum simple ramp-tests for the Weibull distribution and type-I censoring
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+Optimal Accelerated Life Designs for Estimation
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+Planning Life Tests in Which Units Are Inspected for Failure
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+Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
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+Optimum Simple Step-Stress Plans for Accelerated Life Testing
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+Accelerated Life Testing - Step-Stress Models and Data Analyses
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+Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
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+Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution
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+Optimal design of accelerated life tests under periodic inspection
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