Scheduling of wafer test processes in semiconductor manufacturing (Q4474714): Difference between revisions

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+https://doi.org/10.1080/0020754031000118116
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+W2009585302
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+The Shifting Bottleneck Procedure for Job Shop Scheduling
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+An interactive scheduler for a wafer probe centre in semiconductor manufacturing
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+Rolling horizon procedures for dynamic parallel machine scheduling with sequence-dependent setup times
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+The wafer probing scheduling problem (WPSP)
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+Q3989986
@@ Property / cites work: Q3989986 / rank @@
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+Publication:4474714