An improved model-based method to test circuit faults (Q2566007): Difference between revisions

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Latest revision as of 16:32, 10 June 2024

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An improved model-based method to test circuit faults
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    An improved model-based method to test circuit faults (English)
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    22 September 2005
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    Testing
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    Search
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    Deduction
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    Abduction
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    Prime implication
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