A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates (Q850043): Difference between revisions

From MaRDI portal
Importer (talk | contribs)
Created a new Item
 
ReferenceBot (talk | contribs)
Changed an Item
(5 intermediate revisions by 4 users not shown)
Property / author
 
Property / author: William D. Nix / rank
Normal rank
 
Property / author
 
Property / author: William D. Nix / rank
 
Normal rank
Property / MaRDI profile type
 
Property / MaRDI profile type: MaRDI publication profile / rank
 
Normal rank
Property / full work available at URL
 
Property / full work available at URL: https://doi.org/10.1016/j.jmps.2004.08.007 / rank
 
Normal rank
Property / OpenAlex ID
 
Property / OpenAlex ID: W2084333067 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q4308962 / rank
 
Normal rank
links / mardi / namelinks / mardi / name
 

Revision as of 21:52, 24 June 2024

scientific article
Language Label Description Also known as
English
A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates
scientific article

    Statements

    A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates (English)
    0 references
    0 references
    0 references
    15 November 2006
    0 references
    thin films
    0 references
    plasticity
    0 references
    small-scale yielding
    0 references
    strain hardening
    0 references
    MEMS
    0 references
    0 references

    Identifiers