Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272): Difference between revisions

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+MaRDI publication profile
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+Normal rank
@@ Property / full work available at URL @@
+https://doi.org/10.1016/j.ejor.2008.05.031
+Normal rank
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+W2007506434
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+Normal rank
@@ Property / cites work @@
+Optimal Lot Sizing, Process Quality Improvement and Setup Cost Reduction
+Normal rank
@@ Property / cites work @@
+Optimal lot sizing for products sold under free-repair warranty.
+Normal rank
@@ Property / cites work @@
+Lot sizing and testing for items with uncertain quality
+Normal rank
@@ Property / cites work @@
+Optimal lot size and inspection policy for products sold with warranty
+Normal rank
@@ Property / cites work @@
+Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework
+Normal rank
@@ Property / cites work @@
+Invited paper Perspectives and challenges for research in quality and reliability engineering
+Normal rank
@@ Property / cites work @@
+A general minimal repair model
@@ Property / cites work: A general minimal repair model / rank @@
+Normal rank
@@ Property / cites work @@
+Inspection Policies When Duration of Checkings is Non-Negligible
+Normal rank
@@ Property / cites work @@
+A discrete‐time model of failure and repair
@@ Property / cites work: A discrete‐time model of failure and repair / rank @@
+Normal rank