Neural network metamodeling for cycle time-throughput profiles in manufacturing (Q2270307): Difference between revisions

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Latest revision as of 14:21, 2 July 2024

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Neural network metamodeling for cycle time-throughput profiles in manufacturing
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    Neural network metamodeling for cycle time-throughput profiles in manufacturing (English)
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    18 March 2010
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    discrete event simulation
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    response surface modeling
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    design of experiments
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    semiconductor manufacturing
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    queueing
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