Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes (Q3590013): Difference between revisions

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Property / cites work: Accelerated test models with the inverse Gaussian distribution / rank
 
Normal rank
Property / cites work
 
Property / cites work: Accelerated test models for system strength based on Birnbaum-Saunders distributions / rank
 
Normal rank
Property / cites work
 
Property / cites work: Inference from accelerated degradation and failure data based on Gaussian process models / rank
 
Normal rank
Property / cites work
 
Property / cites work: Accelerated degradation models for failure based on geometric Brownian motion and gamma processes / rank
 
Normal rank
Property / cites work
 
Property / cites work: Modelling accelerated degradation data using Wiener diffusion with a time scale transformation / rank
 
Normal rank

Latest revision as of 05:05, 3 July 2024

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Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes
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    Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes (English)
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    17 September 2010
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    Bayesian MCMC method
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    gamma process
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    maximum likelihood estimation
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    step-stress accelerated degradation modeling
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    Wiener process
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    tables
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