Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry (Q542954): Difference between revisions

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Property / Mathematics Subject Classification ID: 62H35 / rank
 
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Property / Mathematics Subject Classification ID
 
Property / Mathematics Subject Classification ID: 92C55 / rank
 
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Property / Mathematics Subject Classification ID: 65C60 / rank
 
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Property / Mathematics Subject Classification ID: 62G05 / rank
 
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Property / zbMATH DE Number
 
Property / zbMATH DE Number: 5910053 / rank
 
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image analysis
Property / zbMATH Keywords: image analysis / rank
 
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semiparametric estimation
Property / zbMATH Keywords: semiparametric estimation / rank
 
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reflection symmetry
Property / zbMATH Keywords: reflection symmetry / rank
 
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two-dimensional functions
Property / zbMATH Keywords: two-dimensional functions / rank
 
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Zernike polynomials
Property / zbMATH Keywords: Zernike polynomials / rank
 
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confocal microscopy
Property / zbMATH Keywords: confocal microscopy / rank
 
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Property / arXiv ID
 
Property / arXiv ID: 1102.0630 / rank
 
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Property / cites work: THE TRANSFORMATION OF POISSON, BINOMIAL AND NEGATIVE-BINOMIAL DATA / rank
 
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Property / cites work
 
Property / cites work: Q4277836 / rank
 
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Property / cites work
 
Property / cites work: Testing for Image Symmetries—With Application to Confocal Microscopy / rank
 
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Property / cites work: Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry / rank
 
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Property / cites work: Q5825858 / rank
 
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Property / cites work: Symmetry Studies / rank
 
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Latest revision as of 05:18, 4 July 2024

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Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry
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    Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry (English)
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    20 June 2011
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    image analysis
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    semiparametric estimation
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    reflection symmetry
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    two-dimensional functions
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    Zernike polynomials
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    confocal microscopy
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