Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions (Q4649607): Difference between revisions

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Property / author: Yin-cai Tang / rank
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Property / author: Hai-Yan Xu / rank
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Property / author: Yin-cai Tang / rank
 
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Property / author: Hai-Yan Xu / rank
 
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Property / full work available at URL: https://doi.org/10.1080/03610926.2012.707456 / rank
 
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Property / OpenAlex ID: W1990477628 / rank
 
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Property / cites work: Optimum simple ramp-tests for the Weibull distribution and type-I censoring / rank
 
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Property / cites work: Q4032001 / rank
 
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Property / cites work: A tampered failure rate model for step-stress accelerated life test / rank
 
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Property / cites work: Accelerated Life Testing - Step-Stress Models and Data Analyses / rank
 
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Property / cites work: Conditions for the coincidence of the TFR, TRV and CE models / rank
 
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Latest revision as of 20:21, 5 July 2024

scientific article; zbMATH DE number 6104776
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English
Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions
scientific article; zbMATH DE number 6104776

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    Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions (English)
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    12 November 2012
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    \(k\)-step step-stress accelerated life test
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    maximum likelihood estimation
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    TFR model
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    type-I censoring
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    Weibull distribution mathematics
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