Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions (Q4649607): Difference between revisions
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| Property / cites work: Optimum simple ramp-tests for the Weibull distribution and type-I censoring / rank | |||
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| Property / cites work: Q4032001 / rank | |||
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| Property / cites work: A tampered failure rate model for step-stress accelerated life test / rank | |||
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| Property / cites work: Q4211180 / rank | |||
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| Property / cites work: Accelerated Life Testing - Step-Stress Models and Data Analyses / rank | |||
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| Property / cites work: Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring / rank | |||
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Latest revision as of 20:21, 5 July 2024
scientific article; zbMATH DE number 6104776
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions |
scientific article; zbMATH DE number 6104776 |
Statements
Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions (English)
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12 November 2012
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\(k\)-step step-stress accelerated life test
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maximum likelihood estimation
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TFR model
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type-I censoring
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Weibull distribution mathematics
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