A note on imposing strong complementary slackness conditions in DEA (Q1926789): Difference between revisions

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+Some Models for Estimating Technical and Scale Inefficiencies in Data Envelopment Analysis
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+Farrell revisited–Visualizing properties of DEA production frontiers
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+The relationship between returns-to-scale properties of interior points and vertex points in DEA models
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+Constructions of economic functions and calculations of marginal rates in DEA using parametric optimization methods
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+Q4326383
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+A combined use of DEA (data envelopment analysis) with strong complementary slackness condition and DEA-DA (discriminant analysis)
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+Measurement of returns to scale using a non-radial DEA model: a range-adjusted measure approach
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+The measurement of returns to scale under a simultaneous occurrence of multiple solutions in a reference set and a supporting hyperplane
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+An occurrence of multiple projections in DEA-based measurement of technical efficiency: theoretical comparison among DEA models from desirable properties
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+Q5674306
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