Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (Q1939763): Difference between revisions
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| Property / full work available at URL: https://doi.org/10.1016/j.mechrescom.2007.08.002 / rank | |||
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Latest revision as of 05:33, 6 July 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films |
scientific article |
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Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (English)
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5 March 2013
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electromechanics
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dielectric
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diffusion
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vacancies
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thin films
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