Controlled random tests (Q376499): Difference between revisions

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+Iterative Exhaustive Pattern Generation for Logic Testing
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+Problems and algorithms for covering arrays
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+The repeated nondestructive march tests with variable address sequences
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+Advances in Computer Science - ASIAN 2004. Higher-Level Decision Making
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+Q4349924
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+Q5665102
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+Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
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