LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS (Q5150757): Difference between revisions

@@ Property / author @@
-Kirill A. Popkov
@@ Property / author: Kirill A. Popkov / rank @@
-Normal rank
@@ Property / author @@
+Kirill A. Popkov
@@ Property / author: Kirill A. Popkov / rank @@
+Normal rank
@@ Property / MaRDI profile type @@
+MaRDI publication profile
@@ Property / MaRDI profile type: MaRDI publication profile / rank @@
+Normal rank
@@ Property / OpenAlex ID @@
+W2566939818
@@ Property / OpenAlex ID: W2566939818 / rank @@
+Normal rank
@@ Property / cites work @@
+Q3268318
@@ Property / cites work: Q3268318 / rank @@
+Normal rank
@@ Property / cites work @@
+Q3471835
@@ Property / cites work: Q3471835 / rank @@
+Normal rank
@@ Property / cites work @@
+Q2968777
@@ Property / cites work: Q2968777 / rank @@
+Normal rank
@@ Property / cites work @@
+Q4071169
@@ Property / cites work: Q4071169 / rank @@
+Normal rank
@@ Property / cites work @@
+Q5684577
@@ Property / cites work: Q5684577 / rank @@
+Normal rank
@@ Property / cites work @@
+Q4330611
@@ Property / cites work: Q4330611 / rank @@
+Normal rank
@@ Property / cites work @@
+Q5665102
@@ Property / cites work: Q5665102 / rank @@
+Normal rank
@@ Property / cites work @@
+Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
+Normal rank
@@ links / mardi / name / links / mardi / name @@
+Publication:5150757