Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (Q2032232): Difference between revisions

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+Optimal designing of skip-lot sampling plan of type SkSP-2 with group acceptance sampling plan as reference plan under Burr-type XII distribution
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+Sampling Plans for Inspection by Variables
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+Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
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+Capability-based quick switching sampling system for lot disposition
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