An overview on recent advances in statistical burn-in modeling for semiconductor devices (Q1793947): Difference between revisions
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Latest revision as of 00:43, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An overview on recent advances in statistical burn-in modeling for semiconductor devices |
scientific article |
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An overview on recent advances in statistical burn-in modeling for semiconductor devices (English)
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12 October 2018
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area scaling
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binomial distribution
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burn-in
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power semiconductors
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sampling
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