Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (Q1939763): Difference between revisions

@@ Property / author @@
-John D. Clayton
@@ Property / author: John D. Clayton / rank @@
-Normal rank
@@ Property / author @@
-Peter W. Chung
@@ Property / author: Peter W. Chung / rank @@
-Normal rank
@@ Property / author @@
-Michael A. Grinfeld
@@ Property / author: Michael A. Grinfeld / rank @@
-Normal rank
@@ Property / author @@
+John D. Clayton
@@ Property / author: John D. Clayton / rank @@
+Normal rank
@@ Property / author @@
+Peter W. Chung
@@ Property / author: Peter W. Chung / rank @@
+Normal rank
@@ Property / author @@
+Michael A. Grinfeld
@@ Property / author: Michael A. Grinfeld / rank @@
+Normal rank
@@ Property / MaRDI profile type @@
+MaRDI publication profile
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@@ Property / full work available at URL @@
+https://doi.org/10.1016/j.mechrescom.2007.08.002
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@@ Property / OpenAlex ID @@
+W2071873242
@@ Property / OpenAlex ID: W2071873242 / rank @@
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@@ Property / cites work @@
+Q5828977
@@ Property / cites work: Q5828977 / rank @@
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@@ Property / cites work @@
+Q4844100
@@ Property / cites work: Q4844100 / rank @@
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@@ Property / cites work @@
+Q3235736
@@ Property / cites work: Q3235736 / rank @@
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