Polynomial identity testing for depth 3 circuits (Q2472430): Difference between revisions

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Latest revision as of 21:37, 19 March 2024

scientific article
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Polynomial identity testing for depth 3 circuits
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    Polynomial identity testing for depth 3 circuits (English)
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    22 February 2008
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    identity testing
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    depth of circuits
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    Chinese remainder
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    rings
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