Some classes of easily testable circuits in the Zhegalkin basis (Q2688833): Difference between revisions

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Property / author: Yulia V. Borodina / rank
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Property / full work available at URL: https://doi.org/10.1515/dma-2023-0001 / rank
 
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Property / cites work: Q3471835 / rank
 
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Property / cites work: Q2968777 / rank
 
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Property / cites work: Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements / rank
 
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Property / cites work: Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs / rank
 
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Property / cites work: A method of synthesis of irredundant circuits admitting single fault detection tests of constant length / rank
 
Normal rank
Property / cites work
 
Property / cites work: A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS / rank
 
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Latest revision as of 14:47, 31 July 2024

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Some classes of easily testable circuits in the Zhegalkin basis
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