A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (Q1306116): Difference between revisions

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Property / DOI: 10.1006/jcph.1999.6249 / rank
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Property / author
 
Property / author: Hong-Kai Zhao / rank
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Property / author: Hua-Jian Gao / rank
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Property / author
 
Property / author: Hong-Kai Zhao / rank
 
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Property / author
 
Property / author: Hua-Jian Gao / rank
 
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Property / MaRDI profile type: MaRDI publication profile / rank
 
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Property / OpenAlex ID: W2085426491 / rank
 
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Property / cites work
 
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Latest revision as of 17:48, 10 December 2024

scientific article
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A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid
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    A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (English)
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    22 September 1999
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    finite difference method
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    numerical examples
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    surface diffusion
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    electric current
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    metal conducting line
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    moving boundaries
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    fourth order nonlinear partial differential equation
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    modified immersed interface method
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    fixed Cartesian grid
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    electrical field
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    local level set method
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    moving voids
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    electromigration
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