Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (Q1939763): Difference between revisions
From MaRDI portal
Set profile property. |
ReferenceBot (talk | contribs) Changed an Item |
||
| (One intermediate revision by one other user not shown) | |||
| Property / full work available at URL | |||
| Property / full work available at URL: https://doi.org/10.1016/j.mechrescom.2007.08.002 / rank | |||
Normal rank | |||
| Property / OpenAlex ID | |||
| Property / OpenAlex ID: W2071873242 / rank | |||
Normal rank | |||
| Property / cites work | |||
| Property / cites work: Q5828977 / rank | |||
Normal rank | |||
| Property / cites work | |||
| Property / cites work: Q4844100 / rank | |||
Normal rank | |||
| Property / cites work | |||
| Property / cites work: Q3235736 / rank | |||
Normal rank | |||
Latest revision as of 05:33, 6 July 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films |
scientific article |
Statements
Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (English)
0 references
5 March 2013
0 references
electromechanics
0 references
dielectric
0 references
diffusion
0 references
vacancies
0 references
thin films
0 references
