An improved model-based method to test circuit faults (Q2566007): Difference between revisions
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Property / full work available at URL: https://doi.org/10.1016/j.tcs.2005.04.004 / rank | |||
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Property / OpenAlex ID: W2002736809 / rank | |||
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Latest revision as of 16:32, 10 June 2024
scientific article
Language | Label | Description | Also known as |
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English | An improved model-based method to test circuit faults |
scientific article |
Statements
An improved model-based method to test circuit faults (English)
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22 September 2005
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Testing
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Search
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Deduction
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Abduction
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Prime implication
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