Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in (Q2875192): Difference between revisions
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Latest revision as of 21:28, 19 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in |
scientific article |
Statements
Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in (English)
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13 August 2014
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arithmetic circuits
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bounded depth circuits
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derandomization
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identity testing
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multilinear circuits
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