Polynomial identity testing for depth 3 circuits (Q2472430): Difference between revisions
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Latest revision as of 20:40, 18 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Polynomial identity testing for depth 3 circuits |
scientific article |
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Polynomial identity testing for depth 3 circuits (English)
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22 February 2008
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identity testing
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depth of circuits
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Chinese remainder
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rings
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