Scheduling of wafer test processes in semiconductor manufacturing (Q4474714): Difference between revisions
From MaRDI portal
Set profile property. |
ReferenceBot (talk | contribs) Changed an Item |
||
(One intermediate revision by one other user not shown) | |||
Property / full work available at URL | |||
Property / full work available at URL: https://doi.org/10.1080/0020754031000118116 / rank | |||
Normal rank | |||
Property / OpenAlex ID | |||
Property / OpenAlex ID: W2009585302 / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: The Shifting Bottleneck Procedure for Job Shop Scheduling / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: An interactive scheduler for a wafer probe centre in semiconductor manufacturing / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Rolling horizon procedures for dynamic parallel machine scheduling with sequence-dependent setup times / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: The wafer probing scheduling problem (WPSP) / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Q3989986 / rank | |||
Normal rank |
Latest revision as of 18:28, 6 June 2024
scientific article; zbMATH DE number 2078834
Language | Label | Description | Also known as |
---|---|---|---|
English | Scheduling of wafer test processes in semiconductor manufacturing |
scientific article; zbMATH DE number 2078834 |
Statements
Scheduling of wafer test processes in semiconductor manufacturing (English)
0 references
12 July 2004
0 references
0 references