Some classes of easily testable circuits in the Zhegalkin basis (Q2688833): Difference between revisions

@@ Property / author @@
-Yulia V. Borodina
@@ Property / author: Yulia V. Borodina / rank @@
-Normal rank
@@ Property / author @@
+Yulia V. Borodina
@@ Property / author: Yulia V. Borodina / rank @@
+Normal rank
@@ Property / MaRDI profile type @@
+MaRDI publication profile
@@ Property / MaRDI profile type: MaRDI publication profile / rank @@
+Normal rank
@@ Property / full work available at URL @@
+https://doi.org/10.1515/dma-2023-0001
+Normal rank
@@ Property / OpenAlex ID @@
+W4321638967
@@ Property / OpenAlex ID: W4321638967 / rank @@
+Normal rank
@@ Property / cites work @@
+Q3471835
@@ Property / cites work: Q3471835 / rank @@
+Normal rank
@@ Property / cites work @@
+Q2968777
@@ Property / cites work: Q2968777 / rank @@
+Normal rank
@@ Property / cites work @@
+Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
+Normal rank
@@ Property / cites work @@
+Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs
+Normal rank
@@ Property / cites work @@
+A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
+Normal rank
@@ Property / cites work @@
+A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS
+Normal rank
@@ links / mardi / name / links / mardi / name @@
+Publication:2688833