Finding ambiguity groups in low testability analog circuits (Q2724344): Difference between revisions

From MaRDI portal
Importer (talk | contribs)
Created a new Item
 
Set OpenAlex properties.
 
(5 intermediate revisions by 4 users not shown)
Property / author
 
Property / author: Janusz A. Starzyk / rank
Normal rank
 
Property / author
 
Property / author: Janusz A. Starzyk / rank
 
Normal rank
Property / describes a project that uses
 
Property / describes a project that uses: Matlab / rank
 
Normal rank
Property / MaRDI profile type
 
Property / MaRDI profile type: MaRDI publication profile / rank
 
Normal rank
Property / OpenAlex ID
 
Property / OpenAlex ID: W2148720062 / rank
 
Normal rank
links / mardi / namelinks / mardi / name
 

Latest revision as of 01:23, 20 March 2024

scientific article
Language Label Description Also known as
English
Finding ambiguity groups in low testability analog circuits
scientific article

    Statements

    Finding ambiguity groups in low testability analog circuits (English)
    0 references
    0 references
    0 references
    0 references
    0 references
    15 December 2002
    0 references
    analog system testing
    0 references
    ambiguity groups
    0 references
    analog fault diagnosis
    0 references
    QR factorization
    0 references

    Identifiers