Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792): Difference between revisions

From MaRDI portal
Added link to MaRDI item.
RedirectionBot (talk | contribs)
Removed claims
Property / author
 
Property / author: Yan-Qing Wu / rank
Normal rank
 
Property / author
 
Property / author: Feng-Lei Huang / rank
Normal rank
 

Revision as of 15:50, 13 February 2024

scientific article
Language Label Description Also known as
English
Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model
scientific article

    Statements

    Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (English)
    0 references
    0 references
    25 February 2020
    0 references
    0 references
    0 references
    0 references
    0 references
    0 references
    0 references
    polymer-bonded explosives
    0 references
    impact-shear ignition
    0 references
    void distortion
    0 references
    shear crack hotspot
    0 references
    void collapse hotspot
    0 references