Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing (Q5131538): Difference between revisions

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scientific article; zbMATH DE number 7271395
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English
Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing
scientific article; zbMATH DE number 7271395

    Statements

    Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing (English)
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    8 November 2020
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    Markov random field
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    yield prediction
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    semiconductor
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    adjacency-clustering
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