Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method (Q1958244): Difference between revisions
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scientific article
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English | Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method |
scientific article |
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Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method (English)
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28 September 2010
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fast multipole method
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boundary element method
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electrostatic problems
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MEMS
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