A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482): Difference between revisions

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Revision as of 18:31, 19 March 2024

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A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
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    A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (English)
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    3 May 2019
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    circuit of gates
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    fault detection test
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    stuck-at fault
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    Shannon function
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    easily testable circuit
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