A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482): Difference between revisions
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Revision as of 18:31, 19 March 2024
scientific article
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English | A method of synthesis of irredundant circuits admitting single fault detection tests of constant length |
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A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (English)
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3 May 2019
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circuit of gates
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fault detection test
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stuck-at fault
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Shannon function
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easily testable circuit
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