Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (Q2032232): Difference between revisions
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Revision as of 19:32, 19 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives |
scientific article |
Statements
Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (English)
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16 June 2021
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quality control
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acceptance sampling
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process yield
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average sample number
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operating characteristic curve
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