An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem (Q2891244): Difference between revisions
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Revision as of 23:08, 19 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem |
scientific article |
Statements
An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem (English)
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13 June 2012
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non-volatile memories
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EEPROM
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flash memory
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CAST
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deconvolution
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counting extrinsic cells
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reliability
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