The Generalized Linear Sampling Method for Limited Aperture Measurements (Q4689631): Difference between revisions

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+Identifying defects in an unknown background using differential measurements
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+A generalized formulation of the linear sampling method with exact characterization of targets in terms of farfield measurements
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+Qualitative methods in inverse scattering theory. An introduction
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+The factorization method for a defective region in an anisotropic material
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+The linear sampling method in inverse electromagnetic scattering theory
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+A simple method for solving inverse scattering problems in the resonance region
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+Inverse acoustic and electromagnetic scattering theory
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+Non-scattering wavenumbers and far field invisibility for a finite set of incident/scattering directions
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+Determining the shape of defects in non-absorbing inhomogeneous media from far-field measurements
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+Near-field imaging of scattering obstacles with the factorization method
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+Q5441004
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+Unconstrained Optimization of Real Functions in Complex Variables
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+Discreteness of Transmission Eigenvalues via Upper Triangular Compact Operators
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