Repetitive Testing in the Presence of Inspection Errors (Q4840425): Difference between revisions
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Repetitive Testing in the Presence of Inspection Errors | |||
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Repetitive Testing in the Presence of Inspection Errors (English) | |||
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Latest revision as of 21:54, 19 March 2024
scientific article; zbMATH DE number 777934
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Repetitive Testing in the Presence of Inspection Errors |
scientific article; zbMATH DE number 777934 |
Statements
14 September 1995
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misclassification
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nonconformances
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semiconductor devices
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retesting
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expected benefit
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Repetitive Testing in the Presence of Inspection Errors (English)
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