Two reliability acceptance sampling plans for items subject to Wiener process of degradation (Q2157399): Difference between revisions

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+A group acceptance sampling plan for truncated life test having Weibull distribution
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+New acceptance sampling plans based on life tests for Birnbaum–Saunders distributions
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+A two-stage group sampling plan based on truncated life tests for a general distribution
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+Optimal designing of skip-lot sampling plan of type SkSP-2 with group acceptance sampling plan as reference plan under Burr-type XII distribution
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+Multiple states repetitive group sampling plans with process loss consideration
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+A mixed repetitive sampling plan based on process capability index
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+Q4277597
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+Acceptance Sampling Plans from Truncated Life Tests Based on the Generalized Birnbaum–Saunders Distribution
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+Analysis of reliability characteristics in the acceptance sampling tests
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+Variables acceptance reliability sampling plan for repairable items
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+Variables acceptance reliability sampling plan based on degradation test
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+Variables acceptance reliability sampling plan for items subject to inverse Gaussian degradation process
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+Optimal Bayesian sampling acceptance plan with random censoring.
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+Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution
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+Truncated Life Tests in the Exponential Case
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+Life Testing
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+Sequential Life Tests in the Exponential Case
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+A Two-Stage Life Test for the Exponential Parameter
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+Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
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+Life-Test Sampling Plans for Two-Parameter Weibull Populations
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+Q4195757
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+Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
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+Degradation Processes in Reliability
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+Stochastic ordering of classical discrete distributions
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+Reliability sampling plan for repairable items following general failure process and its statistical analysis
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+Using Degradation Measures to Estimate a Time-to-Failure Distribution
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+Q4485850
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+Q2778807
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+A Wiener process model with truncated normal distribution for reliability analysis
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+Q4301147
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+Interval censored sampling plans for the gamma lifetime model
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+Wiener processes with random effects for degradation data
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+Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions
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+Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods
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