On the estimation of stress strength reliability parameter of inverted gamma distribution (Q1992081): Difference between revisions

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+Estimation of Pr(<i>X</i> &lt; <i>Y</i>) Using Record Values in the One and Two Parameter Exponential Distributions
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+Likelihood and Bayesian estimation of \(\mathrm{Pr}(X \leq Y)\) using lower record values from the generalized exponential distribution
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+Interval estimation of the stress–strength reliability in the two-parameter exponential distribution based on records
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+A Distribution-Free Upper Confidence Bound for $\Pr \{Y &amp;lt; X\}$, Based on Independent Samples of $X$ and $Y$
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+Logistic Regression, Survival Analysis, and the Kaplan-Meier Curve
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+Computational probability applications
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+Prior distributions for variance parameters in hierarchical models (Comment on article by Browne and Draper)
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+Q4515165
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+Statistical properties of the generalized inverse Gaussian distribution
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+Q4707042
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+Estimation of \(R=P(Y<X)\) for three-parameter Weibull distribution
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+Bayesian Survival Analysis of Head and Neck Cancer Data Using Lognormal Model
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+Estimation of stress-strength reliability using record ranked set sampling scheme from the exponential distribution
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