Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing (Q5131538): Difference between revisions
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Latest revision as of 16:03, 30 December 2024
scientific article; zbMATH DE number 7271395
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing |
scientific article; zbMATH DE number 7271395 |
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Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing (English)
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8 November 2020
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Markov random field
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yield prediction
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semiconductor
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adjacency-clustering
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