Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions
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| Property / Mathematics Subject Classification ID: 90B25 / rank | |||
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| Property / Mathematics Subject Classification ID: 62N05 / rank | |||
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| Property / zbMATH DE Number | |||
| Property / zbMATH DE Number: 6035007 / rank | |||
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reliability | |||
| Property / zbMATH Keywords: reliability / rank | |||
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defect growth | |||
| Property / zbMATH Keywords: defect growth / rank | |||
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defect size distribution | |||
| Property / zbMATH Keywords: defect size distribution / rank | |||
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negative binomial defect density | |||
| Property / zbMATH Keywords: negative binomial defect density / rank | |||
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Revision as of 20:47, 29 June 2023
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Burn-in considering yield loss and reliability gain for integrated circuits |
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Burn-in considering yield loss and reliability gain for integrated circuits (English)
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14 May 2012
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reliability
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defect growth
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defect size distribution
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negative binomial defect density
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