Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (Q441038): Difference between revisions

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Revision as of 02:03, 30 June 2023

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Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples
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    Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (English)
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    20 August 2012
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    asymptotic distribution
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    multiple characteristics
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