Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (Q441038): Difference between revisions
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Property / Mathematics Subject Classification ID: 90B25 / rank | |||
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Property / Mathematics Subject Classification ID: 62P30 / rank | |||
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Property / Mathematics Subject Classification ID: 62N05 / rank | |||
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Property / Mathematics Subject Classification ID: 62F40 / rank | |||
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Property / zbMATH DE Number: 6068567 / rank | |||
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asymptotic distribution | |||
Property / zbMATH Keywords: asymptotic distribution / rank | |||
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multiple characteristics | |||
Property / zbMATH Keywords: multiple characteristics / rank | |||
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Revision as of 02:03, 30 June 2023
scientific article
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English | Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples |
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Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (English)
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20 August 2012
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asymptotic distribution
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multiple characteristics
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